This course contains two lessons on the topic of reliability of analog circuits. The first lesson includes reliability mechanisms of hot carrier injection, gate oxide integrity, time dependent dielectric breakdown, negative bias temperature instability, and electro migration. The theory is illustrated and described with minimum equations.
The second lesson includes reliability practice. Reliability specifications for analog circuits are described along with some tools that are used in reliability design. The goals of reliability design are presented with examples to illustrate how to design an analog circuit to meet a given reliability specification.